A Robust and High-Performance Flip-Flop with Complete Soft-Error Recovery-Reference-Cited by-同舟云学术

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A Robust and High-Performance Flip-Flop with Complete Soft-Error Recovery

Published:2023-08-10 Issue: Volume: Page:
ISSN:
Container-title:2023 10th International Conference on Dependable Systems and Their Applications (DSA)
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Author:

Yan Aibin¹,Li Xuehua¹,Ni Tianming²,Huang Zhengfeng³,Wen Xiaoqing⁴

Affiliation:

1. Anhui University,School of Computer Science & Technology,Hefei,China

2. Anhui Polytechnic University,School of Integrated Circuits,Wuhu,China

3. Hefei University of Technology,School of Microelectronics,Hefei,China

4. Kyushu Institute of Technology,Department of Computer Science and Networks,Fukuoka,Japan

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10314134/10314123/10314406.pdf?arnumber=10314406

Reference12 articles.

1. Design and eva1uation of DNU to1erant registers for resi1ient architectura1 state storage;alghareb;IEEE/ACM GLSVLSI,2019

2. A 1ow power and area efficient radiation hard redundant f1ip f1op, DICE ACFF;kobayashi;IEEE TNS,2014

3. Cost-Effective and Highly Reliable Circuit-Components Design for Safety-Critical Applications

4. Dual-interlocked-storage-cell-based double-node-upset self-recoverable flip-flop design;yan;IEEE ISCAS,2020

5. Single event double-upset fully immune and transient pulse filterable latch design for nanoscale CMOS

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