Development of basic fault model and corresponding ATPG for single input missing cell deposition defects in Majority Voter of QCA
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IEEE
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http://xplorestaging.ieee.org/ielx7/7838019/7847944/07848451.pdf?arnumber=7848451
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Missing-cell defects in QCA wires: The ground and excited electronic states perspectives;Results in Physics;2024-09
2. Assessing the Impact of Defects on Energy Dissipation of QCA LT Gate using ML Models;2023 IEEE Devices for Integrated Circuit (DevIC);2023-04-07
3. Logic Synthesis Method for Quantum-dot Cellular Automata Circuits;TENCON 2022 - 2022 IEEE Region 10 Conference (TENCON);2022-11-01
4. Development of Test Pattern Generation for QCA-Based Circuits;Evolutionary Computing and Mobile Sustainable Networks;2022
5. Multiple Missing Cell Defect Modeling for QCA Devices;Journal of Electronic Testing;2018-11-20
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