An Area Efficient Built-in Phase Testing Equipment for Phased Array Front-End ICs
Author:
Affiliation:
1. University of Bordeaux,Talence,France,33405
2. NXP Semiconductors,Caen,France,14000
3. Bordeaux INP,Talence,France,33405
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10181241/10181318/10181675.pdf?arnumber=10181675
Reference15 articles.
1. A Ka-band digitally-controlled phase shifter with sub-degree phase precision
2. Novel Built-In Test Equipment for Phase Measurement in Millimeter-Wave Phased Arrays Integrated Circuits With Absolute Phase Measurement Capabilities
3. RF microelectronics;razavi;ser Prentice Hall Communications Engineering and emerging Technologies Series,1998
4. Design of a 5G Application CML Frequency Divider for Improved Efficiency
5. A 24.2-30.5GHz Quad-Channel RFIC for 5G Communications including Built-In Test Equipment
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