On-Chip Threshold Voltage Variability Estimation Using Reconfigurable Ring Oscillator-Reference-Cited by-同舟云学术

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On-Chip Threshold Voltage Variability Estimation Using Reconfigurable Ring Oscillator

Published:2019-05 Issue:2 Volume:32 Page:226-235
ISSN:0894-6507
Container-title:IEEE Transactions on Semiconductor Manufacturing
language:
Short-container-title:IEEE Trans. Semicond. Manufact.

Author:

Jain Poorvi^ORCID,Das Bishnu Prasad^ORCID

Funder

Science and Engineering Research Board (SERB), Department of Science and Technology, Government of India

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/66/8704169/08691465.pdf?arnumber=8691465

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A 5800 μm² Process Monitor Circuit for Measurement of in-Die Variation of Vth in 65nm;IEEE Transactions on Circuits and Systems II: Express Briefs;2021-03

2. Design and Analysis of Leakage-Induced False Error Tolerant Error Detecting Latch for Sub/Near-Threshold Applications;IEEE Transactions on Device and Materials Reliability;2020-06

3. On-chip static and dynamic monitors for low power applications;CSI Transactions on ICT;2020-06

4. Reducing the Impact of Local Load Variation on the DUT in a Process Detector Using a Supply Controlled Ring Oscillator;IEEE Transactions on Semiconductor Manufacturing;2019-11

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