A Survey on Security Threats and Countermeasures in IEEE Test Standards
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Link
http://xplorestaging.ieee.org/ielx7/6221038/8726120/08641446.pdf?arnumber=8641446
Cited by 22 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. SASL-JTAG: A Light-Weight Dependable JTAG;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03
2. High Throughput and Energy Efficient SHA-2 ASIC Design for Continuous Integrity Checking Applications;2023 IEEE European Test Symposium (ETS);2023-05-22
3. A Novel Secure Scan Design Based on Delayed Physical Unclonable Function;Computers, Materials & Continua;2023
4. An Authentication-Based Secure IJTAG Network;2022 IEEE 31st Asian Test Symposium (ATS);2022-11
5. Circuit-to-Circuit Attacks in SoCs via Trojan-Infected IEEE 1687 Test Infrastructure;2022 IEEE International Test Conference (ITC);2022-09
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