The effective resolution measurements in scope of sine-fit test
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation
Link
http://xplorestaging.ieee.org/ielx4/19/15713/00728787.pdf?arnumber=728787
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Explicit Kernel and Sparsity of Eigen Subspace for the AR(1) Process;Financial Signal Processing and Machine Learning;2016-04-29
2. Quantization of Eigen Subspace for Sparse Representation;IEEE Transactions on Signal Processing;2015-07
3. Corrected rms error and effective number of bits for sine wave ADC tests;Computer Standards & Interfaces;2004-01
4. Effective resolution of analog to digital converters - evolution of accuracy;IEEE Instrumentation & Measurement Magazine;2003-09
5. Reference properties of uniform quantizers—comparison of Widrow's and direct approaches;Computer Standards & Interfaces;2003-03
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