Lifetime Estimation of HD-GITs based on Drain Leakage Current
Author:
Affiliation:
1. Chongqing University,State Key Laboratory of Power Transmission Equipment and System Security and New Technology,China
2. Guangdong University of Technology,School of Integrated Circuits,China
3. Southwest Jiaotong University,China
Funder
National Natural Science Foundation of China
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx8/10567049/10567050/10568024.pdf?arnumber=10568024
Reference15 articles.
1. A review of gallium nitride power device and its applications in motor drive
2. Review of Commercial GaN Power Devices and GaN-Based Converter Design Challenges
3. GaN-on-Si Power Technology: Devices and Applications
4. Power Cycling Test Methods for Reliability Assessment of Power Device Modules in Respect to Temperature Stress
5. Overview of Real-Time Lifetime Prediction and Extension for SiC Power Converters
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