On Tracing Screen Photos-A Moiré Pattern-based Approach-Reference-Cited by-同舟云学术

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On Tracing Screen Photos-A Moiré Pattern-based Approach

Published:2023 Issue: Volume: Page:1-17
ISSN:1545-5971
Container-title:IEEE Transactions on Dependable and Secure Computing
language:
Short-container-title:IEEE Trans. Dependable and Secure Comput.

Author:

Xu Wenyuan¹,Cheng Yushi²^ORCID,Ji Xiaoyu¹^ORCID,Chen Yi-Chao³^ORCID

Affiliation:

1. Ubiquitous System Security Lab (USSLAB), Zhejiang University, Hangzhou, CN, China

2. Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, CN, China

3. Department of Computer Science and Engineering, Shanghai Jiao Tong University, Shanghai, CN, China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/8858/4358699/10197578.pdf?arnumber=10197578

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