Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software
Cited by
9 articles.
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1. Functional Test Sequences as a Source for Partially Functional Launch-on-Shift Tests;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2022-11
2. Covering Test Holes of Functional Broadside Tests;ACM Transactions on Design Automation of Electronic Systems;2021-05-31
3. Functional Broadside Tests Under Broadcast Scan;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-10
4. Globally Functional Transparent-Scan Sequences;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-10
5. Extracting a Close-to-Minimum Multicycle Functional Broadside Test Set From a Functional Test Sequence;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2019-06