Author:
Fugger Matthias,Nowak Thomas,Schmid Ulrich
Cited by
3 articles.
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1. Gain and Pain of a Reliable Delay Model;2021 24th Euromicro Conference on Digital System Design (DSD);2021-09
2. Transistor-Level Analysis of Dynamic Delay Models;2019 25th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC);2019-05
3. Experimental Validation of a Faithful Binary Circuit Model;Proceedings of the 25th edition on Great Lakes Symposium on VLSI;2015-05-20