Performance and Reliability Co-design of Ultra High Voltage LDMOS Devices-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Performance and Reliability Co-design of Ultra High Voltage LDMOS Devices

Published:2022-12-11 Issue: Volume: Page:
ISSN:
Container-title:2022 IEEE International Conference on Emerging Electronics (ICEE)
language:
Short-container-title:

Author:

Variar Harsha B¹,Somayaji Jhnanesh¹,Shrivastava Mayank¹

Affiliation:

1. Indian Institute of Science,Electronic Systems Engineering,Bangalore,India

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10117590/10117577/10117871.pdf?arnumber=10117871

Reference30 articles.

1. A simulation study of SOI RESURF junctions for HV LDMOS (>600V)

2. A new double epitaxial layer dielectric isolation technology for HVICs

3. high voltage thin layer devices (resurf devices);appels;1979 International Electron Devices Meeting,1979

4. Dependence of breakdown voltage on drift length and linear doping gradients in SOI RESURF LDMOS devices

5. A new ESD self-protection structure for 700V high side gate drive IC

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP