Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A Real-Time Detection Method For Wafer Probe Reference Die Shift;2023 China Semiconductor Technology International Conference (CSTIC);2023-06-26
2. An Industry Example to Reduce the Test Time by Optimizing Data Extration Method;2022 China Semiconductor Technology International Conference (CSTIC);2022-06-20