Correlated Bayesian Co-Training for Virtual Metrology-Reference-Cited by-同舟云学术

Correlated Bayesian Co-Training for Virtual Metrology

Published:2023-02 Issue:1 Volume:36 Page:28-36
ISSN:0894-6507
Container-title:IEEE Transactions on Semiconductor Manufacturing
language:
Short-container-title:IEEE Trans. Semicond. Manufact.

Author:

Nguyen Cuong¹^ORCID,Li Xin²^ORCID,Blanton Shawn³^ORCID,Li Xiang⁴

Affiliation:

1. Machine Intellection Department, Institute for Infocomm Research, Fusionopolis, Singapore

2. Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA

3. Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA, USA

4. Manufacturing Systems Research Group, Singapore Institute of Manufacturing Technology, Tampines, Singapore

Funder

Agency for Science, Technology and Research of Singapore

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/66/10036056/09930821.pdf?arnumber=9930821

Reference36 articles.

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3. Graph-based Semi-Supervised Regression and Its Extensions

4. A 18mW, 3.3dB NF, 60GHz LNA in 32nm SOI CMOS technology with autonomic NF calibration

5. A survey on multi-view learning;xu;arXiv 1304 5634,2013

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