Charge Quantity Influence on Resistance Switching Characteristic During Forming Process-Reference-Cited by-同舟云学术

Charge Quantity Influence on Resistance Switching Characteristic During Forming Process

Published:2013-04 Issue:4 Volume:34 Page:502-504
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:
Short-container-title:IEEE Electron Device Lett.

Author:

Chu Tian-Jian,Chang Ting-Chang,Tsai Tsung-Ming,Wu Hsing-Hua,Chen Jung-Hui,Chang Kuan-Chang,Young Tai-Fa,Chen Kai-Hsang,Syu Yong-En,Chang Geng-Wei,Chang Yao-Feng,Chen Min-Chen,Lou Jyun-Hao,Pan Jhih-Hong,Chen Jian-Yu,Tai Ya-Hsiang,Ye Cong,Wang Hao,Sze Simon M.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/55/6484111/06473822.pdf?arnumber=6473822

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