Unsupervised Sequential Outlier Detection With Deep Architectures-Reference-Cited by-同舟云学术

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Unsupervised Sequential Outlier Detection With Deep Architectures

Published:2017-09 Issue:9 Volume:26 Page:4321-4330
ISSN:1057-7149
Container-title:IEEE Transactions on Image Processing
language:
Short-container-title:IEEE Trans. on Image Process.

Author:

Lu Weining^ORCID,Cheng Yu^ORCID,Xiao Cao,Chang Shiyu,Huang Shuai,Liang Bin,Huang Thomas

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx7/83/7956620/07942034.pdf?arnumber=7942034

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