Robotic Probing of Nanostructures inside Scanning Electron Microscopy-Reference-Cited by-同舟云学术

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Robotic Probing of Nanostructures inside Scanning Electron Microscopy

Published:2014-06 Issue:3 Volume:30 Page:758-765
ISSN:1552-3098
Container-title:IEEE Transactions on Robotics
language:
Short-container-title:IEEE Trans. Robot.

Author:

Gong Zheng,Chen Brandon K.,Liu Jun,Sun Yu

Funder

Natural Sciences and Engineering Research Council of Canada under a Strategic Projects Grant and by the Canada Research Chairs Program

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications,Control and Systems Engineering

Link

http://xplorestaging.ieee.org/ielx7/8860/6824878/06725637.pdf?arnumber=6725637

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