Spherical Near-Field Scanning With Higher-Order Probes
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx5/8/6062567/05979181.pdf?arnumber=5979181
Cited by 47 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. On the Feasibility of Antenna Pattern Measurement Using Arbitrarily Polarized/Orientated Probe in Reverberation Chamber;2024 IEEE International Workshop on Radio Frequency and Antenna Technologies (iWRF&AT);2024-05-31
2. Reconstruction of the Far-Field Pattern Radiated by an Elongated Antenna Measured over a Perfectly Electric Conducting Ground Plane in a Spherical Spiral Near-Field Facility;2024 18th European Conference on Antennas and Propagation (EuCAP);2024-03-17
3. An Effective Spherical NF/FF Transformation Suitable for Characterising an Antenna under Test in Presence of an Infinite Perfectly Conducting Ground Plane;Electronics;2024-01-18
4. Evaluation of the Far-Field Pattern Radiated by a Long AUT in Presence of an Infinite Perfectly Electric Conducting Ground Plane from Spherical Spiral Near-Field Measurements;2023 Antenna Measurement Techniques Association Symposium (AMTA);2023-10-08
5. Three-Antenna Characterization Techniques Employing Spherical Near-Field Scanning With Higher-Order Probe Correction;IEEE Transactions on Antennas and Propagation;2023-09
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