Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Cited by
69 articles.
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1. Predictive Maintenance of Electrical Machines using Machine Learning and Condition Monitoring Data;2024 International Conference on Advances in Computing, Communication and Applied Informatics (ACCAI);2024-05-09
2. Test Methodology for Defect-Based Bridge Faults;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2022-07
3. A Novel Foundry Yield Model Using Critical Area Analysis;IEEE Transactions on Semiconductor Manufacturing;2021-08
4. Defect-Oriented Test: Effectiveness in High Volume Manufacturing;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2021-03
5. Fast, high-capacity critical area analysis (CAA) with advanced FINFET defectivity calculation;Design-Process-Technology Co-optimization XV;2021-02-22