Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons-Reference-Cited by-同舟云学术

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Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons

Published:2023-03 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE International Reliability Physics Symposium (IRPS)
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Author:

Takami Kazusa¹,Gomi Yuibi¹,Abe Shin-Ichiro²,Liao Wang³,Manabe Seiya⁴,Matsumoto Tetsuro⁴,Hashimoto Masanori¹

Affiliation:

1. Kyoto University,Dept. Communications and Computer Engineering

2. Nuclear Science and Engineering Center, Japan Atomic Energy Agency

3. Photon Science Center, University of Tokyo

4. National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST)

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10117589/10117581/10118134.pdf?arnumber=10118134

Reference12 articles.

1. The Los Alamos Neutron Science Center

2. Analytical Model for Estimating the Zenith Angle Dependence of Terrestrial Cosmic Ray Fluxes

3. NOBORU: J-PARC BL10 for facility diagnostics and its possible extension to innovative instruments

4. Improved capabilities for proton and neutron irradiations at TRIUMF

5. Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets

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