M-type Cathode Emission Degradation Simulation based on Surface Coating Degradation Mechanisms
Author:
Affiliation:
1. Electronic Devices and System Reliability Center Southeast University,Nanjing,China
2. School of Microelectronic Southeast University,Wuxi,China
3. Beijing Vacuum Electronics Research Institute,Beijing,China
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10291014/10292180/10292400.pdf?arnumber=10292400
Reference15 articles.
1. os-coated cathode for very high emission-density applications;shih;IEEE Transactions on Electron Devices,1987
2. A work model for barium dispenser cathodes with the surface covered by metal Os, Ir or Os 〈Ir〉 W alloy layer
3. GaN Schottky barrier diodes with nickel nitride anodes sputtered at different nitrogen partial pressure
4. Performance degradation simulation for M-type cathode based on ion bombardment
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