Silicon Technology Inspired Test Structures and Methodology for SFQ Model-to-Hardware Correlation-Reference-Cited by-同舟云学术

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Silicon Technology Inspired Test Structures and Methodology for SFQ Model-to-Hardware Correlation

Published:2019-08 Issue:5 Volume:29 Page:1-7
ISSN:1051-8223
Container-title:IEEE Transactions on Applied Superconductivity
language:
Short-container-title:IEEE Trans. Appl. Supercond.

Author:

Bhushan Manjul^ORCID,Timmerwilke John,Amparo Denis,Gibson Gerald W.,Ketchen Mark B.

Funder

Office of the Director of National Intelligence

Intelligence Advanced Research Projects Activity ODNI, IARPA

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/77/8626749/08638584.pdf?arnumber=8638584

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Differential Propagation Delay Measurement of RSFQ Library Cells Using Ring Oscillators;IEEE Transactions on Applied Superconductivity;2022-06

2. ERSFQ Power Delivery: A Self-Consistent Model/Hardware Case Study;IEEE Transactions on Applied Superconductivity;2019-10

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