Integrating embedded test infrastructure in SRAM cores to detect aging-Reference-Cited by-同舟云学术

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Integrating embedded test infrastructure in SRAM cores to detect aging

Published:2013-07 Issue: Volume: Page:
ISSN:
Container-title:2013 IEEE 19th International On-Line Testing Symposium (IOLTS)
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Author:

Prates W.,Bolzani L.,Harutyunyan G.,Davtyan A.,Vargas F.,Zorian Y.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/6589052/6604040/06604046.pdf?arnumber=6604046

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. On-Chip Sensor to Monitor Aging Evolution in FinFET-Based Memories;2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS);2024-07-03

2. Silicon Lifecycle Management Based on On-Chip Cross-Layer Sensing and Analytics for Space Applications;2024 IEEE 25th Latin American Test Symposium (LATS);2024-04-09

3. Highly Reliable Memory Architecture Using Adaptive Combination of Proactive Aging-Aware In-Field Self-Repair and ECC;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-08

4. An On-Chip Sensor to Monitor NBTI Effects in SRAMs;Journal of Electronic Testing;2014-04

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