Author:
Almukhaizim Sobeeh,Makris Yiorgos,Yang Yu-shen,Veneris Andreas
Cited by
3 articles.
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1. A defect tolerance framework for improving yield;Proceedings of the 59th ACM/IEEE Design Automation Conference;2022-07-10
2. Low Cost Concurrent Error Masking Using Approximate Logic Circuits;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2013-08
3. Automating Logic Transformations With Approximate SPFDs;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2011-05