Author:
Guardiani C.,Shibkov A.,Brambilla A.,Storti Gajani G.,Appello D.,Piazza F.,Bernardi P.
Cited by
1 articles.
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1. Aging Estimation of
MOS FETs
Using
Aging‐Tolerant
/Aged Ring Oscillators;IEEJ Transactions on Electrical and Electronic Engineering;2020-09-04