Integration of an IIoT Platform with A Deep Learning Based Computer Vision System for Seedling Quality Control Automation

Author:

S. Erick Fiestas,O. Paulo Linares,A. Jorge Alva,G. Sixto Prado

Publisher

IEEE

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Advanced Computational Analysis of Artichoke Varieties in India: A Deep Dive into Green Globe, Imperial Star, and Big Heart;2024 11th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO);2024-03-14

2. Deep Learning-based Segmentation and Classification System for Artichoke Seedling Grading;2023 IEEE XXX International Conference on Electronics, Electrical Engineering and Computing (INTERCON);2023-11-02

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