Affiliation:
1. Istituto di Scienza e Tecnologie dell'Informazione, Pisa, Italy
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Cited by
2 articles.
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1. System reliability evaluation and dynamic optimization based on an improved reliability block diagram;Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability;2023-07-01
2. TAPAS;ACM SIGMETRICS Performance Evaluation Review;2022-06-02