A Wiener Process Model With Dynamic Covariate for Degradation Modeling and Remaining Useful Life Prediction
Author:
Affiliation:
1. School of Management, Shanghai University, Shanghai, China
2. Business School, Manchester Metropolitan University, Manchester, U.K.
3. School of Economics and Management, University of Science and Technology Beijing, Beijing, China
Funder
National Natural Science Foundation of China
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Link
http://xplorestaging.ieee.org/ielx7/24/10057590/09765626.pdf?arnumber=9765626
Reference43 articles.
1. Remaining useful life estimation using an inverse Gaussian degradation model
2. A Wiener-Process-Model-Based Method for Remaining Useful Life Prediction Considering Unit-to-Unit Variability
3. A General Stochastic Degradation Modeling Approach for Prognostics of Degrading Systems With Surviving and Uncertain Measurements
4. Exponential-Dispersion Degradation Process Models With Random Effects and Covariates
5. Optimal Two-Variable Accelerated Degradation Test Plan for Gamma Degradation Processes
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