Determination of surface- and bulk-generation parameters from dark-current measurements in surface-channel CCD's
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Published:1985-09
Issue:9
Volume:32
Page:1662-1664
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ISSN:0018-9383
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Container-title:IEEE Transactions on Electron Devices
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language:
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Short-container-title:IEEE Trans. Electron Devices
Author:
Chik K.D.,Kriegler R.J.,Devenyi T.F.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials