A Modified Two-Line Method for Determining Dielectric Properties of Unknown Materials
Author:
Affiliation:
1. School of Computer Science and Engineering, Huizhou University,Guangdong,China,516007
2. Glorious Sun Guangdong School of Fashion, Huizhou University,Guangdong,China,516007
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10244769/10244774/10244980.pdf?arnumber=10244980
Reference9 articles.
1. An Accurate and Instantaneous Permittivity Measurement Using Modified Multi-line Method
2. Broadband Material Characterization Method Using a CPW With a Novel Calibration Technique
3. Foundations for Microwave Engineering
4. Determination of dielectric properties of unknown substrates using hybrid approach
5. Dielectric Properties of Textile Materials: Analytical Approximations and Experimental Measurements—A Review
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