Testing for Parallelism Among Trends in Multiple Time Series-Reference-Cited by-同舟云学术

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Testing for Parallelism Among Trends in Multiple Time Series

Published:2012-03 Issue:3 Volume:60 Page:1087-1097
ISSN:1053-587X
Container-title:IEEE Transactions on Signal Processing
language:
Short-container-title:IEEE Trans. Signal Process.

Author:

Degras David,Xu Zhiwei,Zhang Ting,Wu Wei Biao

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Signal Processing

Link

http://xplorestaging.ieee.org/ielx5/78/6146821/06094237.pdf?arnumber=6094237

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