High-precision dielectric measurements on liquids and solids at millimeter and submillimeter wavelengths-Reference-Cited by-同舟云学术

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High-precision dielectric measurements on liquids and solids at millimeter and submillimeter wavelengths

Published:1976-12 Issue:4 Volume:IM-25 Page:290-294
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Afsar M. N.,Chamberlain John,Chantry George W.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx5/19/6312221/06312229.pdf?arnumber=6312229

Cited by 48 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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3. Implementation of Cavity Perturbation Method for Determining Relative Permittivity of Non Magnetic Materials;Mehran University Research Journal of Engineering and Technology;2017-04-01

4. Measurement of Microwave Dielectric Properties and Factors Affecting Them;Microwave Materials and Applications 2V Set;2017-03-25

5. Wideband Relative Permittivity Characterization of Thin Low Permittivity Textile Materials Based on Ridge Gap Waveguides;IEEE Transactions on Microwave Theory and Techniques;2016-11

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