Author:
Pancher Fabrice,Vargas Vanessa,Ramos Pablo,Bastos Rodrigo Possamai,Saravia David Cesar Ardiles,Velazco Raoul
Cited by
1 articles.
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1. SEU Reliability Assessment Framework for COTS Many-core Processors;2022 International Conference on Microelectronics (ICM);2022-12-04