Reference-Guided Landmark Image Inpainting With Deep Feature Matching
Author:
Affiliation:
1. Department of Electronic Engineering and Information Science, University of Science and Technology of China, Hefei, China
Funder
National Key Research and Development Program of China
National Natural Science Foundation of China
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Media Technology
Link
http://xplorestaging.ieee.org/ielx7/76/9973795/09840396.pdf?arnumber=9840396
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