Learned Model Composition With Critical Sample Look-Ahead for Semi-Supervised Learning on Small Sets of Labeled Samples-Reference-Cited by-同舟云学术

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Learned Model Composition With Critical Sample Look-Ahead for Semi-Supervised Learning on Small Sets of Labeled Samples

Published:2021-09 Issue:9 Volume:31 Page:3444-3455
ISSN:1051-8215
Container-title:IEEE Transactions on Circuits and Systems for Video Technology
language:
Short-container-title:IEEE Trans. Circuits Syst. Video Technol.

Author:

Li Yang^ORCID,Kan Shichao^ORCID,Wenming Cao^ORCID,He Zhihai^ORCID

Funder

National Science Foundation

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Media Technology

Link

https://ieeexplore.ieee.org/ielam/76/9527373/9261608-aam.pdf

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Self Pseudo Entropy Knowledge Distillation for Semi-Supervised Semantic Segmentation;IEEE Transactions on Circuits and Systems for Video Technology;2024-08

2. Adaptive Weighted Losses With Distribution Approximation for Efficient Consistency-Based Semi-Supervised Learning;IEEE Transactions on Circuits and Systems for Video Technology;2022-11

3. Geometric algebra graph neural network for cross-domain few-shot classification;Applied Intelligence;2022-02-05

4. Generated Pseudo-labels Guided by Background Skeletons for Overcoming Under-segmentation in Overlapping Particle Objects;IEEE Transactions on Circuits and Systems for Video Technology;2022

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