ADC sinewave histogram testing with quasi-coherent sampling
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation
Link
http://xplorestaging.ieee.org/ielx5/19/20525/00948305.pdf?arnumber=948305
Cited by 17 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. The Accuracy of Determining the Phase During the Development of the Emergency Mode by the Piecewise Overlay Method;2022 Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus);2022-01-25
2. One-Bit Sine-Fit;IEEE Transactions on Instrumentation and Measurement;2021
3. An Improved Sine Wave Histogram Test Method for ADC Characterization;IEEE Transactions on Instrumentation and Measurement;2019-10
4. Parameterization of nonideal quantizers for simultaneous estimation of quantizer and excitation signal parameters;Measurement;2017-12
5. Parameters and Methods for ADCs Testing Compliant With the Guide to the Expression of Uncertainty in Measurements;IEEE Transactions on Instrumentation and Measurement;2017-03
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