General Model for Manufacturing Defect Detection Crossing Multiple Products-Reference-Cited by-同舟云学术

General Model for Manufacturing Defect Detection Crossing Multiple Products

Published:2023-12-15 Issue: Volume: Page:1595-1600
ISSN:
Container-title:2023 International Conference on Machine Learning and Applications (ICMLA)
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Author:

Zhou Longfei¹,Qin Zhanghao²,Xia Ping³,Liu Jiabao⁴,Cheng Weihao⁵,Li Yunwei⁶,Ying Leyi⁷,Liu Qian³,Liu Mengxin²,Song Gezhang⁶,Huang Zebo⁸,Hao Zhou⁹

Affiliation:

1. Gannon University,Biomedical, Industrial and Systems Engineering Department,Erie,PA,USA

2. School of Artificial Intelligence and Computer Science, Jiangnan University,Wuxi,China

3. School of Atmospheric Science, Nanjing University of Information Science and Technology,NanJing,China

4. School of Computer Science and Artificial Intelligence, Suzhou City College,Suzhou,China

5. School of Physics and Optoelectronic Engineering, Nanjing University of Information Science and Technology,Nanjing,China

6. School of Computer Science and Communication Engineering, Jiangsu University,ZhenJiang,China

7. School of Mechanical Engineering, Jiangnan University,Wuxi,China

8. College of Artificial Intelligence and Computer Science, Jiangnan University,Wuxi,China

9. School of Internet of Things Engineering, Jiangnan University,Wuxi,China

Publisher

IEEE

Link

Reference23 articles.