A Survey of Non-Raster Scan Methods with Application to Atomic Force Microscopy
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Publisher
IEEE
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http://xplorestaging.ieee.org/ielx5/4282134/4282135/04282301.pdf?arnumber=4282301
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Spiral high-speed scanning tunneling microscopy: Tracking atomic diffusion on the millisecond timescale;Applied Physics Letters;2021-12-20
2. Image-based feedback control for drift compensation in an electron microscope;IFAC Journal of Systems and Control;2020-03
3. A comparison of scanning methods and the vertical control implications for scanning probe microscopy;Asian Journal of Control;2016-12-12
4. Control Techniques for Increasing the Scan Speed and Minimizing Image Artifacts in Tapping-Mode Atomic Force Microscopy: Toward Video-Rate Nanoscale Imaging;IEEE Control Systems;2013-12
5. Reconstruction of Undersampled Atomic Force Microscopy Images: Interpolation versus Basis Pursuit;2013 International Conference on Signal-Image Technology & Internet-Based Systems;2013-12
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