AC scan path selection for physical debugging

Author:

Crouch A.L.,Potter J.C.,Doege A.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software,Electrical and Electronic Engineering,Hardware and Architecture,Software

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Emerging (un-)reliability based security threats and mitigations for embedded systems;Proceedings of the 2017 International Conference on Compilers, Architectures and Synthesis for Embedded Systems Companion;2017-10-15

2. Invited - A box of dots;Proceedings of the 53rd Annual Design Automation Conference;2016-06-05

3. Statistical Path Selection for At-Speed Test;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2010-05

4. Design For At-Speed Structural Test And Performance Verification Of High-Performance ASICs;IEEE Custom Integrated Circuits Conference 2006;2006-09

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