1. An Efficient Time-Tick based BIST Scheme to Calculate Static Errors of ADC;2023 International Conference on Intelligent Technologies for Sustainable Electric and Communications Systems (iTech SECOM);2023-12-18
2. Design and Simulation of a Self-Test Technique for High Frequency MEMS Actuators;2022 2nd International Conference on Advances in Engineering Science and Technology (AEST);2022-10-24
3. Analog and Mixed-Signal Test;Electronic Design Automation for IC System Design, Verification, and Testing;2016-04-14
4. Exploiting Pipeline ADC Properties for a Reduced-Code Linearity Test Technique;IEEE Transactions on Circuits and Systems I: Regular Papers;2015-10
5. Oscillation-based analog diagnosis using artificial neural networks based inference mechanism;Computers & Electrical Engineering;2013-02