High Speed Terahertz TDS Scanner for Automatic Detection of Defects-Reference-Cited by-同舟云学术

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High Speed Terahertz TDS Scanner for Automatic Detection of Defects

Published:2023-11-05 Issue: Volume: Page:250-252
ISSN:
Container-title:2023 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference (IMOC)
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Author:

Palka Norbert¹,Kaminski Kamil¹,Maciejewski Marcin¹,Synaszko Piotr²,Dragan Krzysztof²

Affiliation:

1. Institute of Optoelectronics, Military University of Technology,Warsaw,Poland

2. Air Force Institute of Technology,Warsaw,Poland

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10379643/10379657/10379664.pdf?arnumber=10379664

Reference7 articles.

1. Twenty years of terahertz imaging [Invited]

2. Double-Sided Terahertz Imaging of Multilayered Glass Fiber-Reinforced Polymer

3. Nondestructive evaluation of GFRP composite including multi-delamination using THz spectroscopy and imaging

4. Terahertz Quality Inspection for Automotive and Aviation Industries

5. Industrial Applications of Terahertz Imaging

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