Author:
Li Donghui,Spencer Mychal,Pallaka Madhusudhan R.,Bisel Tucker T.,Ni Yelin,Zwoster Andy,Murphy Mark K.,Fifield Leonard S.
Funder
U.S. Department of Energy
Cited by
1 articles.
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1. Foreign Material Identification by FTIR Characterization with Novel FIB Lamella Preparation;2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA);2023-07-24