Assessment of Tiny Machine-Learning Computing Systems Under Neutron-Induced Radiation Effects-Reference-Cited by-同舟云学术

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Assessment of Tiny Machine-Learning Computing Systems Under Neutron-Induced Radiation Effects

Published:2022-07 Issue:7 Volume:69 Page:1683-1690
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Possamai Bastos Rodrigo¹^ORCID,Trindade Matheus Garay¹^ORCID,Garibotti Rafael²^ORCID,Gava Jonas³^ORCID,Reis Ricardo³^ORCID,Ost Luciano⁴^ORCID

Affiliation:

1. Univ. Grenoble Alpes, CNRS, Grenoble Institut National Polytechnique Grenoble Alpes, TIMA, Grenoble, France

2. School of Technology, Pontifical Catholic University of Rio Grande do Sul, Porto Alegre, Brazil

3. Instituto de Informatica, PGMicro, Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil

4. Wolfson School, Loughborough University, Loughborough, U.K.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx7/23/9830888/09777913.pdf?arnumber=9777913

Reference33 articles.

1. THE USE OF MULTIPLE MEASUREMENTS IN TAXONOMIC PROBLEMS

2. Evaluation of the soft error assessment consistency of a JIT‐based virtual platform simulator

3. Dependability and Its Threats: A Taxonomy

4. Experimental Findings on the Sources of Detected Unrecoverable Errors in GPUs

5. Assessment of Machine Learning Algorithms for Near-Sensor Computing under Radiation Soft Errors

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1. Assessment of Radiation-Induced Soft Error on Unmanned Surface Vehicles;IEEE Transactions on Nuclear Science;2024-08

2. Soft Error Assessment of Attitude Estimation Algorithms Running on Resource-Constrained Devices Under Neutron Radiation;IEEE Transactions on Nuclear Science;2024-08

3. Evaluating the Reliability of Supervised Compression for Split Computing;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22

4. Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection;2024 IEEE 25th Latin American Test Symposium (LATS);2024-04-09

5. Investigation of edge computing hardware architectures processing tiny machine learning under neutron-induced radiation effects;Microelectronics Reliability;2023-11

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