Author:
Anderson T.L.,Chandramouli R.,Dey S.,Hemmady S.,Mallipeddi C.,Rajsuman R.,Walther R.,Zorian Y.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software,Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
2 articles.
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1. SoC Self Test Based on a Test-Processor;Design and Test Technology for Dependable Systems-on-Chip
2. Test and Design-for-Test: from Circuits to Integrated Systems;Design of Systems on a Chip: Design and Test