Author:
Ke Yalin,Stolee Kathryn T.,Goues Claire Le,Brun Yuriy
Cited by
138 articles.
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1. Improving Patch Correctness Analysis via Random Testing and Large Language Models;2024 IEEE Conference on Software Testing, Verification and Validation (ICST);2024-05-27
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3. Automated Program Repair, What Is It Good For? Not Absolutely Nothing!;Proceedings of the IEEE/ACM 46th International Conference on Software Engineering;2024-04-12
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