A Method to Characterize the Shrinking of Safe Operation Area of Metallized Film Capacitor Considering Electrothermal Coupling and Aging in Power Electronics Applications-Reference-Cited by-同舟云学术

A Method to Characterize the Shrinking of Safe Operation Area of Metallized Film Capacitor Considering Electrothermal Coupling and Aging in Power Electronics Applications

Published:2023-02 Issue:2 Volume:70 Page:1993-2002
ISSN:0278-0046
Container-title:IEEE Transactions on Industrial Electronics
language:
Short-container-title:IEEE Trans. Ind. Electron.

Author:

Lv Chunlin¹^ORCID,Liu Jinjun¹^ORCID,Zhang Yan¹^ORCID,Yin Jinpeng¹^ORCID,Cao Rui¹,Li Yang¹^ORCID,Liu Xue¹^ORCID

Affiliation:

1. State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi'an Jiaotong University, Xi'an, China

Funder

National Key Research and Development Plan

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Control and Systems Engineering

Link

http://xplorestaging.ieee.org/ielx7/41/9913345/09744567.pdf?arnumber=9744567

Reference40 articles.

1. Accelerated AC degradation of impregnated PP films

2. Breakdown voltage of polypropylene film during C and thermal ageing

3. Reliability Modeling and Analysis on Metallized Film Capacitors for MMC

4. Accelerated Ageing of Metallized Film Capacitors Under High Ripple Currents Combined With a DC Voltage

5. Online degradation of biaxial-orientated polypropylene film from HVDC filter capacitors

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