Minimum Operating Voltage Prediction in Production Test Using Accumulative Learning
Author:
Funder
MediaTek
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9611037/9611298/09611347.pdf?arnumber=9611347
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Domain-Specific Machine Learning Based Minimum Operating Voltage Prediction Using On-Chip Monitor Data;2023 IEEE International Test Conference (ITC);2023-10-07
2. MMANet: Margin-Aware Distillation and Modality-Aware Regularization for Incomplete Multimodal Learning;2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR);2023-06
3. Vmin Prediction Using Nondestructive Stress Test;2023 IEEE 41st VLSI Test Symposium (VTS);2023-04-24
4. ML-Assisted VminBinning with Multiple Guard Bands for Low Power Consumption;2022 IEEE International Test Conference (ITC);2022-09
5. A Systematic Literature Review on Machine Learning Approaches for Quality Monitoring and Control Systems for Welding Processes;2021 IEEE International Conference on Big Data (Big Data);2021-12-15
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