Smart Sampling for Efficient System Level Test: A Robust Machine Learning Approach-Reference-Cited by-同舟云学术

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Smart Sampling for Efficient System Level Test: A Robust Machine Learning Approach

Published:2021-10 Issue: Volume: Page:
ISSN:
Container-title:2021 IEEE International Test Conference (ITC)
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Author:

Liu Chenwei,Ou Jie

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9611037/9611298/09611327.pdf?arnumber=9611327

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. AI/ML algorithms and applications in VLSI design and technology;Integration;2023-11

2. Automating Greybox System-Level Test Generation;2023 IEEE European Test Symposium (ETS);2023-05-22

3. A low‐cost digital calibration scheme for high‐resolution SAR ADC using Adaptive‐LMS;Electronics Letters;2022-11-03

4. Efficient and Robust Resistive Open Defect Detection Based on Unsupervised Deep Learning;2022 IEEE International Test Conference (ITC);2022-09

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