Author:
Bhojwani P.S.,Mahapatra R.N.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
5 articles.
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1. Dependability Threats;Dependable Multicore Architectures at Nanoscale;2017-08-30
2. Transparent lifetime built-in self-testing of networks-on-chip through the selective non-concurrent testing of their communication channels;Proceedings of the 2nd International Workshop on Advanced Interconnect Solutions and Technologies for Emerging Computing Systems;2017-01-25
3. Tolerating transient illegal turn faults in NoCs;Microprocessors and Microsystems;2016-06
4. Online traffic-aware fault detection for networks-on-chip;Journal of Parallel and Distributed Computing;2014-01
5. A New Architecture to Cross-Fertilize On-Line and Manufacturing Testing;2011 Asian Test Symposium;2011-11