Funder
National Science Foundation
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
3 articles.
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1. Test Data Compression for Transparent-Scan Sequences;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-04
2. Preponing Fault Detections for Test Compaction Under Transparent Scan;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2022-10
3. Static Test Compaction using Independent Suffixes of a Transparent-Scan Sequence;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2021