Test Data Compression Using Selective Encoding of Scan Slices-Reference-Cited by-同舟云学术

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Test Data Compression Using Selective Encoding of Scan Slices

Published:2008-11 Issue:11 Volume:16 Page:1429-1440
ISSN:1063-8210
Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
language:
Short-container-title:IEEE Trans. VLSI Syst.

Author:

Zhanglei Wang ,Chakrabarty K.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx5/92/4655424/04595672.pdf?arnumber=4595672

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. New scan compression approach to reduce the test data volume;IET Computers & Digital Techniques;2021-03-18

2. Fault-Tolerant Unicast-Based Multicast for Reliable Network-on-Chip Testing;ACM Transactions on Design Automation of Electronic Systems;2018-12-21

3. Augmented Recurrence Hopping Based Run-Length Coding for Test Data Compression Applications;Wireless Personal Communications;2018-02-15

4. Input Test Data Compression Based on the Reuse of Parts of Dictionary Entries: Static and Dynamic Approaches;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2013-11

5. Virtual scan chains reordering using a RAM-based module for high test compression;Microelectronics Journal;2012-11

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